Reliability of GaAs Discrete FETs
We demostrates the high temperature DC life test results of Transcom T5 (2.44mm) The devices exhibit an extrapolated DC lifetime of more than 108 hours at 110 °C Channel Temperature. The MTTF test results derived from three elevated channel temperatures of 226 °C, 246 °C and 260 °C. Failure of the devices defined as 20 % degradation in Idss from room temperature values.To download the file. Please click here...
Standard Wafer Evaluation